Ugo Russo

1. Filament Conduction and Reset Mechanism in NiO-Based Resistive-Switching Memory (RRAM) Devices
   2009/01/20 by Ugo Russo, Daniele Ielmini, Carlo Cagli +2 · 22 citations
   Engineering · Materials Science · #Advanced Memory and Neural Computing #Transition Metal Oxide Nanomaterials #Ferroelectric and Negative Capacitance Devices