Jacopo Franco

1. The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction–Diffusion to Switching Oxide Traps
   2011/10/05 by Tibor Grasser, Ben Kaczer, Wolfgang Goes +12 · 12 citations
   Engineering · #Semiconductor materials and devices #Advancements in Semiconductor Devices and Circuit Design #Advanced Memory and Neural Computing