Y. Tsiatouhas
- Soft error interception latch: double node charge sharing SEU tolerant design
2015/02/01 by K. Katsarou, Katerina Katsarou, Y. Tsiatouhas +1 · 1 citation
Engineering · Computer Science · #Radiation Effects in Electronics #VLSI and Analog Circuit Testing #Low-power high-performance VLSI design