Albert Schulte
- Constant‐Distance Mode Scanning Electrochemical Microscopy (SECM)—Part I: Adaptation of a Non‐Optical Shear‐Force‐Based Positioning Mode for SECM Tips
2003/05/05 by Bernardo Ballesteros Katemann, Albert Schulte, Wolfgang Schuhmann · 5 citations
Chemistry · Physics and Astronomy · Chemical Engineering · #Electrochemical Analysis and Applications #Force Microscopy Techniques and Applications #Analytical Chemistry and Sensors #Scanning electrochemical microscopy #Optics #SIGNAL (programming language) #Amplifier #Shear force #Materials science #Non-contact atomic force microscopy #Piezoelectricity #Vibration #Amplitude #Acoustics #Optoelectronics #Microscopy #Physics #Kelvin probe force microscope #Electrode
- Constant‐Distance Mode Scanning Electrochemical Microscopy. Part II: High‐Resolution SECM Imaging Employing Pt Nanoelectrodes as Miniaturized Scanning Probes
2004/01/01 by Bernardo Ballesteros Katemann, Albert Schulte, Wolfgang Schuhmann · 2 citations
Chemistry · Physics and Astronomy · Materials Science · #Electrochemical Analysis and Applications #Force Microscopy Techniques and Applications #Conducting polymers and applications #Scanning electrochemical microscopy #Materials science #Resolution (logic) #LIGA #Scanning probe microscopy #Microscopy #Optics #Nanotechnology #Chemistry #Electrochemistry #Electrode #Physics