Colin Morton

1. New Approach for Measuring Lateral Diffusion in Langmuir Monolayers by Scanning Electrochemical Microscopy (SECM): Theory and Application
   2001/10/20 by Jie Zhang, Christopher J. Slevin, Colin Morton +3 · 3 citations
   Chemistry · Materials Science · Chemical Engineering · #Electrochemical Analysis and Applications #Conducting polymers and applications #Analytical Chemistry and Sensors #Ultramicroelectrode #Monolayer #Scanning electrochemical microscopy #Chemistry #Diffusion #Langmuir #Analytical Chemistry (journal) #Solution of Schrödinger equation for a step potential #Redox #Electrochemistry #Cyclic voltammetry #Electrode #Chemical physics #Inorganic chemistry #Physical chemistry #Thermodynamics #Chromatography #Adsorption