Kim MKelvey
- Intermittent Contact−Scanning Electrochemical Microscopy (IC−SECM): A New Approach for Tip Positioning and Simultaneous Imaging of Interfacial Topography and Activity
2010/06/28 by Kim MKelvey, Martin A. Edwards, Patrick R. Unwin · 2 citations
Chemical Engineering · Chemistry · Physics and Astronomy · #Analytical Chemistry and Sensors #Chemistry #Cyclic voltammetry #Electrochemical Analysis and Applications #Electrochemistry #Electrode #Force Microscopy Techniques and Applications #Microscopy #Nanotechnology #Optics #Scanning electrochemical microscopy #Scanning probe microscopy #Ultramicroelectrode