Alina Pleli

1. Iterative Cluster Harvesting for Wafer Map Defect Patterns
   2024/04/23 by Alina Pleli, Simon Baeuerle, Pleli, Alina +9 · 2 citations
   Computer Science · Engineering · #Advancements in Photolithography Techniques #Computer Vision and Pattern Recognition (cs.CV) #Digital Image Processing Techniques #FOS: Computer and information sciences #Industrial Vision Systems and Defect Detection