The probing depth of total electron yield in the sub-keV range: TEY-XAS and X-PEEM

2003/05/12 by B. H. Frazer, Bradley H Frazer, Benjamin Gilbert +4 · 2 citations
Materials Science · Physics and Astronomy · #Electron and X-Ray Spectroscopy Techniques #X-ray Spectroscopy and Fluorescence Analysis #Nuclear Physics and Applications

paper · doi:10.1016/s0039-6028(03)00613-7

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