The probing depth of total electron yield in the sub-keV range: TEY-XAS and X-PEEM

2003/05/12 by B. H. Frazer, Bradley H Frazer, Benjamin Gilbert +4 · 252 citations
Chemistry · Materials Science · Physics and Astronomy · #Absorption (acoustics) #Analytical Chemistry (journal) #Atomic physics #Auger #Auger effect #Auger electron spectroscopy #Chemistry #Electron #Electron and X-Ray Spectroscopy Techniques #Materials science #Nuclear Physics and Applications #Optics #Physics #Range (aeronautics) #Secondary electrons #Spectral line #X-ray Spectroscopy and Fluorescence Analysis #Yield (engineering)

paper · doi:10.1016/s0039-6028(03)00613-7

published in Surface Science 537(1-3), 161-167 (Elsevier BV)

openalex publication_date 2003/05/12 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

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