Powder synthesis and electrical, dielectric spectroscopic characterization of rare earth disilicates (D-Er2Si2O7): Transistor scaling-22 nm or beyond

2012/07/24 by Shahid Ameer, Asghari Maqsood
Materials Science · #Glass properties and applications #Phase-change materials and chalcogenides #Crystal Structures and Properties

paper · doi:10.1016/j.ssc.2012.07.015

Citations

• Frequency-dependent loss in amorphous semiconductors
• A.c. conduction in amorphous chalcogenide and pnictide semiconductors
• Polarons in crystalline and non-crystalline materials