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Understanding the direct detection of charged particles with SiPMs

2022/10/20 by F. Carnesecchi, Carnesecchi, F., G. Vignola +69 · 1 citation
Physics and Astronomy · Chemical Engineering · Engineering · #Radiation Detection and Scintillator Technologies #Analytical Chemistry and Sensors #CCD and CMOS Imaging Sensors

paper · pdf · doi:10.48550/arxiv.2210.13244

Abstract

In this paper evidence that the increased response of SiPM sensors to the passage of charged particles is related mainly to Cherenkov light produced in the protection layer is reported. The response and timing properties of sensors with different protection layers have been studied.

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