2013/02/27 by Phil Attard, Attard, Phil
Chemistry · Physics and Astronomy · #Chemical Physics (physics.chem-ph) #Electrostatics and Colloid Interactions #FOS: Physical sciences #Fluid Dynamics (physics.flu-dyn) #Force Microscopy Techniques and Applications #Instrumentation and Detectors (physics.ins-det) #Soft Condensed Matter (cond-mat.soft) #Surface and Thin Film Phenomena #cond-mat.soft #physics.chem-ph #physics.flu-dyn #physics.ins-det
paper · pdf · doi:10.48550/arxiv.1302.6630
18 pages, 11 figures (improved discussion of cantilever drag)
openalex publication_date 2013/02/27 · arxiv created 2013/03/06 · arxiv updated 2013/03/07 · openalex created_date 2016/06/24 · openalex updated_date 2026/07/28
Further improvements are made to the non-linear data analysis algorithm for the atomic force microscope [P. Attard, arXiv:1212.3019v2 (2012)]. The algorithm is required when there is curvature in the compliance region due to photo-diode non-linearity. Results are obtained for the hydrodynamic drainage force, for three surfaces: hydrophilic silica (symmetric, Si-Si), hydrophobic dichlorodimethylsilane (symmetric, DCDMS-DCDMS), and hydrophobic octadecyltrichlorosilane (asymmetric, Si-OTS). The drainage force was measured in the viscous liquid di-n-octylphthalate. The slip-lengths are found to be 3nm for Si, 2nm for DCDMS, and 2nm for OTS, with an uncertainty on the order of a nanometer. These slip lengths are a factor of 4--15 times smaller than those obtained from previous analysis of the same raw data [L. Zhu et al., Langmuir, 27, 6712 (2011). Ibid, 28, 7768 (2012)].