2014/06/13 by Mahesh Tiwari, M K Tiwari, Tiwari, M K +2
Engineering · Physics and Astronomy · #FOS: Physical sciences #Force Microscopy Techniques and Applications #Magneto-Optical Properties and Applications #Materials Science (cond-mat.mtrl-sci) #Mesoscale and Nanoscale Physics (cond-mat.mes-hall) #Photonic and Optical Devices #cond-mat.mes-hall #cond-mat.mtrl-sci
paper · pdf · doi:10.48550/arxiv.1406.3581
arxiv created 2014/06/13 · openalex publication_date 2014/06/13 · arxiv updated 2014/06/16 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
We present a unified elucidation for the role temporal coherence properties of x-rays in surface x-ray standing wave analysis, under total external reflection condition. Analytical formulas have been derived that provide a direct relation between the intensity distribution of x-ray standing wave (XSW) pattern and complex degree of coherence of the incoming x-rays. The novelty of the proposed method has been demonstrated experimentally together with the theoretical results for a real application by analyzing the distribution of metal nanoparticles on a Si mirror surface. Our results demonstrate that the modified XSW approach opens up an opportunity to unambiguously interpret structural studies of large dimension nanostructure materials of height 200nm (or more), deposited on a substrate surface.