2013/05/08 by I. S. Spevak, Spevak, I. S., M. Tymchenko +18
Engineering · Physics and Astronomy · #FOS: Physical sciences #Optics (physics.optics) #Photonic Crystals and Applications #Photonic and Optical Devices #Plasmonic and Surface Plasmon Research #physics.optics
paper · pdf · doi:10.48550/arxiv.1305.1785
arxiv created 2013/05/08 · openalex publication_date 2013/05/08 · arxiv updated 2013/05/09 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
Resonance diffraction of THz HCN laser radiation on a semiconductor (InSb) grating is studied both experimentally and theoretically. The specular reflectivity suppression due to the resonance excitation of the THz surface plasmon-polariton is observed on a pure semiconductor grating and on semiconductor gratings covered with a thin striped layer of the residual photoresist. Presence of a thin dielectric layer on the grating surface leads to the shift and widening of the plasmon-polariton resonance. A simple analytical theory of the resonance diffraction on a shallow grating covered with a dielectric layer is presented. Its results are in a good accordance with the experimental data. Analytical expressions for the resonance shift and broadening can be useful for sensing data interpretation.