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A Fast Image Simulation Algorithm for Scanning Transmission Electron\n Microscopy

2017/02/07 by Colin Ophus, Ophus, Colin · 5 citations
Biochemistry, Genetics and Molecular Biology · Materials Science · Physics and Astronomy · #Advanced Electron Microscopy Techniques and Applications #Advanced X-ray Imaging Techniques #Computational Physics (physics.comp-ph) #Electron and X-Ray Spectroscopy Techniques #FOS: Physical sciences #Materials Science (cond-mat.mtrl-sci)

paper · pdf · doi:10.48550/arxiv.1702.01904

openalex publication_date 2017/02/07 · openalex created_date 2022/10/01 · openalex updated_date 2026/07/28

Abstract

Image simulation for scanning transmission electron microscopy at atomic\nresolution for samples with realistic dimensions can require very large\ncomputation times using existing simulation algorithms. We present a new\nalgorithm named PRISM that combines features of the two most commonly used\nalgorithms, the Bloch wave and multislice methods. PRISM uses a Fourier\ninterpolation factor f that has typical values of 4-20 for atomic resolution\nsimulations. We show that in many cases PRISM can provide a speedup that scales\nwith f4 compared to multislice simulations, with a negligible loss of\naccuracy. We demonstrate the usefulness of this method with large-scale\nscanning transmission electron microscopy image simulations of a crystalline\nnanoparticle on an amorphous carbon substrate.\n

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