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The role of double ionization on the generation of doubly charged ions in copper vacuum arcs: insight from particle-in-cell/direct simulation Monte Carlo methods

2021/09/01 by Wei Yang, Yang, Wei, Qianhong Zhou +7
Engineering · Physics and Astronomy · #Advanced Sensor Technologies Research #FOS: Physical sciences #Plasma Physics (physics.plasm-ph) #Semiconductor materials and devices #Vacuum and Plasma Arcs

paper · pdf · doi:10.48550/arxiv.2109.00214

openalex publication_date 2021/09/01 · openalex created_date 2021/09/13 · openalex updated_date 2026/07/28

Abstract

Metal vapour vacuum arcs are capable to generate multiply charged metallic ions, which are widely used in fields such as ion deposition, ion thrusters, and ion sources, etc. According to the stationary model of cathode spot, those ions are generated by electron-impact single ionization in a step-wise manner, which is M -> M+ -> M2+ -> ... mainly. This paper is designed to study quantitatively the role of double ionization M -> M2+ in the breakdown initiation of copper vacuum arcs. A direct simulation Monte Carlo (DSMC) scheme of double ionization is proposed and incorporated into a 2D particle-in-cell (PIC) method. The super-particles of Cu2+ ions generated from different channels are labelled independently in the PIC-DSMC modelling of vacuum arc breakdown. The cathode erosion rate based on PIC modelling is about 40μg/C in arc burning regime, which agrees well with previous experiments. The temporal discharge behaviours such as arc current, arc voltage, and ionization degree of arc plasma, are influenced with or without double ionization negligibly. However, additional Cu2+ ions are generated near the cathode in breakdown initiation from the double ionization channel, with a lower kinetic energy on average. Therefore, the results on spatial distribution and energy spectra of Cu2+ ions are different with or without double ionization. This paper provides a quantitative research method to evaluate the role of multiply ionization in vacuum arcs.

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