2020/03/04 by A. Trimèche, C. Lopez, Trimeche, A. +5 · 1 citation
Engineering · Physics and Astronomy · #Atomic Physics (physics.atom-ph) #FOS: Physical sciences #Instrumentation and Detectors (physics.ins-det) #Integrated Circuits and Semiconductor Failure Analysis #Laser-Matter Interactions and Applications #Random lasers and scattering media
paper · pdf · doi:10.48550/arxiv.2003.02186
openalex publication_date 2020/03/04 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
In this Letter, we report a demonstration of ion and electron ghost imaging. Two beams of correlated ions and electrons are produced by a photoionization process and accelerated into opposite directions. Using a single time and position sensitive detector for one beam, we can image an object seen by the other beam even when the detector that sees this object has no spatial resolution. The extra information given by this second detector can, therefore, be used to reconstruct the image thanks to the correlation between the ions and the electrons. In our example, a metallic mask placed in front of a time-sensitive detector is used as the object to image. We demonstrated ion and electron ghost imaging using this mask in a transmission mode. These primary results are very promising and open applications especially in ion and electron imaging in surface science and nanophysics.