1993/06/01 by Robin Shealy, Robin T. Shealy, William Stout · 6 citations
Decision Sciences · Psychology · Computer Science · #Psychometric Methodologies and Testing #Cognitive Abilities and Testing #Advanced Statistical Modeling Techniques
paper · doi:10.1007/bf02294572
A model-based modification (SIBTEST) of the standardization index based upon a multidimensional IRT bias modeling approach is presented that detects and estimates DIF or item bias simultaneously for several items. A distinction between DIF and bias is proposed. SIBTEST detects bias/DIF without the usual Type 1 error inflation due to group target ability differences. In simulations, SIBTEST performs comparably to Mantel-Haenszel for the one item case. SIBTEST investigates bias/DIF for several items at the test score level (multiple item DIF called differential test functioning: DTF), thereby allowing the study of test bias/DIF, in particular bias/DIF amplification or cancellation and the cognitive bases for bias/DIF.