2024/08/20 by Sarah Heine, Heine, Sarah N. T., Herman L. Marshall +9 · 2 citations
Engineering · Physics and Astronomy · #Advanced X-ray and CT Imaging #FOS: Physical sciences #Instrumentation and Methods for Astrophysics (astro-ph.IM) #Particle Detector Development and Performance #X-ray Spectroscopy and Fluorescence Analysis
paper · pdf · doi:10.48550/arxiv.2408.11168
openalex publication_date 2024/08/20 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
The MIT X-ray Polarimetry Beamline is a facility that we developed for testing components for possible use in X-ray polarimetry. Over the past few years, we have demonstrated that the X-ray source can generate nearly 100% polarized X-rays at various energies from 183 eV (Boron Kα) to 705 eV (Fe Lα) using a laterally graded multilayer coated mirror (LGML) oriented at 45° to the source. The position angle of the polarization can be rotated through a range of roughly 150°. In a downstream chamber, we can orient a Princeton Instruments MTE1300B CCD camera to observe the polarized light either directly or after reflection at 45° by a second LGML. In support of the REDSoX Polarimeter project, we have tested four other detectors by directly comparing them to the PI camera. Two were CCD cameras: a Raptor Eagle XV and a CCID94 produced by MIT Lincoln Laboratories, and two had sCMOS sensors: the Sydor Wraith with a GSENSE 400BSI sensor and a custom Sony IMX290 sensor. We will show results comparing quantum efficiencies and event images in the soft X-ray band.