Depth dependent local structures in thin films unraveled by grazing incidence x-ray absorption spectroscopy

2009/01/28 by Narcizo M. Souza-Neto, N. M. Souza-Neto, Aline Y. Ramos +9
Engineering · Materials Science · Physics and Astronomy · #Electron and X-Ray Spectroscopy Techniques #FOS: Physical sciences #Magnetic properties of thin films #Materials Science (cond-mat.mtrl-sci) #Metal and Thin Film Mechanics #cond-mat.mtrl-sci

paper · pdf · doi:10.48550/arxiv.0901.4542

5 pages, 3 figures

arxiv created 2009/01/28 · openalex publication_date 2009/01/28 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

A method of using X-ray absorption spectroscopy (XAS) together with resolved grazing incidence geometry for depth profiling atomic, electronic, chemical or magnetic local structures in thin films is presented. The quantitative deconvolution of thickness-dependent spectral features is performed by fully considering both scattering and absorption formalisms. Surface oxidation and local structural depth profiles in nanometric FePt films are determined, exemplifying the application of the method.

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