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Correlating atom probe tomography with X-Ray and electron spectroscopies to understand microstructure-activity relationships in electrocatalysts

2022/03/22 by Baptiste Gault, Gault, Baptiste, Kevin Schweinar +11
Engineering · Physics and Astronomy · #Advanced Materials Characterization Techniques #FOS: Physical sciences #Force Microscopy Techniques and Applications #Ion-surface interactions and analysis #Materials Science (cond-mat.mtrl-sci)

paper · pdf · doi:10.48550/arxiv.2203.11524

openalex publication_date 2022/03/22 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/01

Abstract

The search for a new energy paradigm with net-zero carbon emissions requires new technologies for energy generation and storage that are at the crossroad between engineering, chemistry, physics, surface and materials sciences. To keep pushing the inherent boundaries of device performance and lifetime, we need to step away from a cook-and-look approach and aim to establish the scientific ground to guide the design of new materials. This requires strong efforts in establishing bridges between microscopy and spectroscopy techniques, across multiple scales. Here, we discuss how the complementarities of X-ray- and electron-based spectroscopies and atom probe tomography can be exploited in the study of surfaces and sub-surfaces to understand structure-property relationships in electrocatalysts.

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