Consequences of the background in piezoresponse force microscopy on the imaging of ferroelectric domain structures

2007/07/01 by T. JUNGK, T. Jungk, Á. HOFFMANN +3 · 7 citations
Materials Science · Physics and Astronomy · #Ferroelectric and Piezoelectric Materials #Photorefractive and Nonlinear Optics #Force Microscopy Techniques and Applications

paper · pdf · doi:10.1111/j.1365-2818.2007.01783.x

Abstract

The interpretation of ferroelectric domain images obtained with a piezoresponse force microscope (PFM) is discussed. The influence of an inherent experimental background on the domain contrast in PFM images (enhancement, nulling, inversion) as well as on the shape and the location of the domain boundaries are described. We present experimental results to evidence our analysis of the influence of the background on the domain contrast in PFM images.

Cited by

• Morphotropic Phase Boundary in Sm-Substituted BiFeO3 Ceramics: Local vs Microscopic Approaches
• Quantitative Electromechanical Atomic Force Microscopy
• Reconstruction of the domain orientation distribution function of polycrystalline PZT ceramics using vector piezoresponse force microscopy. [europepmc]
• Recent Progress in the Nanoscale Evaluation of Piezoelectric and Ferroelectric Properties via Scanning Probe Microscopy. [europepmc]
• Piezoelectric Nanomaterials Activated by Ultrasound: The Pathway from Discovery to Future Clinical Adoption. [europepmc]
• Reversible long-range domain wall motion in an improper ferroelectric. [europepmc]
• Nanoscale electrostatic control in ferroelectric thin films through lattice chemistry. [europepmc]

Related

• Resolution Function Theory in Piezoresponse Force Microscopy: Domain Wall Profile, Spatial Resolution, and Tip Calibration
• Depth resolution in piezoresponse force microscopy
• Revisiting contrast mechanism of lateral piezoresponse force microscopy
• Ferroelectric or non-ferroelectric: why so many materials exhibit\n ferroelectricity on the nanoscale
• Quantitative piezoelectric force microscopy: Influence of tip shape, size, and contact geometry on the nanoscale resolution of an antiparallel ferroelectric domain wall