2020/10/30 by Andris Bērziņš, Berzins, Andris, Jānis Šmits +3
Materials Science · Physics and Astronomy · #Applied Physics (physics.app-ph) #Diamond and Carbon-based Materials Research #Electronic and Structural Properties of Oxides #FOS: Physical sciences #Force Microscopy Techniques and Applications
paper · pdf · doi:10.48550/arxiv.2010.16197
openalex publication_date 2020/10/30 · openalex created_date 2022/07/25 · openalex updated_date 2026/07/28
In this work we present results acquired by applying magnetic field imaging\ntechnique based on Nitrogen-Vacancy centres in diamond crystal for\ncharacterization of magnetic thin films defects. We used the constructed\nwide-field magnetic microscope for measurements of two kinds of magnetic\ndefects in thin films. One family of defects under study was a result of\nnon-optimal thin film growth conditions. The magnetic field maps of several\nregions of the thin films created under very similar conditions to previously\npublished research revealed microscopic impurity islands of ferromagnetic\ndefects, that potentially could disturb the magnetic properties of the surface.\nThe second part of the measurements was dedicated to defects created post\ndeposition - mechanical defects introduced in ferromagnetic thin films. In both\ncases, the measurements identify the magnetic field amplitude and distribution\nof the magnetic defects. In addition, the magnetic field maps were correlated\nwith the corresponding optical images. As this method has great potential for\nquality control of different stages of magnetic thin film manufacturing process\nand it can rival other widely used measurement techniques, we also propose\nsolutions for the optimization of the device in the perspective of high\nthroughput.\n