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X-Ray Imaging Spectrometer (XIS) on Board Suzaku

2007/01/30 by Katsuji Koyama, H. Tsunemi, Hiroshi Tsunemi +52 · 10 citations
Physics and Astronomy · #Particle Detector Development and Performance #Astrophysical Phenomena and Observations #Advanced X-ray Imaging Techniques

paper · doi:10.1093/pasj/59.sp1.s23

Abstract

The XIS is an X-ray Imaging Spectrometer system, consisting of state-of-the-art charge-coupled devices (CCDs) optimized for X-ray detection, camera bodies, and control electronics. Four sets of XIS sensors are placed at the focal planes of the grazing-incidence, nested thin-foil mirrors (XRT: X-Ray Telescope) onboard the Suzaku satellite. Three of the XIS sensors have front-illuminated CCDs, while the other has a back-illuminated CCD. Coupled with the XRT, the energy range of 0.2–12 keV with energy resolution of 130 eV at 5.9 keV, and a field of view of 18^′ × 18^′ are realized. Since the Suzaku launch on 2005 July 10, the XIS has been functioning well.

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