2022/03/01 by M. J. Basso, J. Fernandez-Tejero, J. Fernández-Tejero +18 · 8 citations
Engineering · Physics and Astronomy · #Application-specific integrated circuit #Chip #Computer hardware #Computer science #Embedded system #Event (particle physics) #Large Hadron Collider #Modular design #Nuclear physics #Operating system #Particle Detector Development and Performance #Physics #Radiation #Radiation Detection and Scintillator Technologies #Radiation Effects in Electronics #Radiation hardening #Redundancy (engineering) #Single event upset #Static random-access memory #Telecommunications #hep-ex #physics.ins-det
paper · pdf · open access · doi:10.1088/1748-0221/17/03/p03017
published in Journal of Instrumentation 17(03), P03017 (Institute of Physics) · published in Journal of Instrumentation
openalex publication_date 2022/03/01 · arxiv created 2022/03/23 · arxiv updated 2022/03/25 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/05
Single Event Effects (SEEs) - predominately bit-flips in electronics caused by particle interactions - are a major concern for ASICs operated in high radiation environments such as ABCStar ASICs, which are designed to be used in the future ATLAS ITk strip tracker. The chip design is therefore optimised to protect it from SEEs by implementing triplication techniques such as Triple Modular Redundancy (TMR). In order to verify the radiation protection mechanisms of the chip design, the cross-section for Single Event Upsets (SEUs), a particular class of SEEs, is measured by exposing the chip to high-intensity particle beams while monitoring it for observed SEUs. This study presents the setup, the performed measurements, and the results from SEU tests performed using the latest version of the ABCStar ASIC (ABCStar V1) using a 480 MeV proton beam.