2024/08/21 by Michal Horák, Peter Kepič, Horák, Michal +13
Chemical Engineering · Engineering · Materials Science · #Catalysis and Oxidation Reactions #FOS: Physical sciences #Materials Science (cond-mat.mtrl-sci) #Photoacoustic and Ultrasonic Imaging #Transition Metal Oxide Nanomaterials
paper · pdf · doi:10.48550/arxiv.2408.11972
openalex publication_date 2024/08/21 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28
We present annular dark field scanning transmission electron microscopy (ADF-STEM) as an efficient, fast, and non-destructive nanoscale tool for monitoring solid-state phase transition. Using metal-insulator transition in vanadium dioxide nanoparticles as an example, we characterize lattice and electronic signatures of the phase transition using analytical transmission electron microscopy including diffraction and electron energy-loss spectroscopy. We demonstrate that ADF-STEM shows a clear contrast across the transition, interpreted with the help of convergent electron beam diffraction as stemming from the crystal-lattice modification accompanying the transition. In addition, ADF-STEM utilizes 3--6 orders of magnitude lower electron dose when compared to electron microscopy techniques able to reveal the phase transition with the same spatial resolution and universality. The benefits of ADF-STEM are emphasized by recording a full hysteresis loop for the metal-insulator transition of a single vanadium dioxide nanoparticle. Our study opens the prospect for fast, non-destructive, large-area and nanoscale characterization of solid-state phase transitions.