2020/08/31 by Dorri Halbertal, Nathan R. Finney, Sai S. Sunku +20
Materials Science · Physics and Astronomy · #2D Materials and Applications #Bilayer #Bilayer graphene #Field (mathematics) #Graphene research and applications #Metrology #Quantum metrology #Stacking #Superlattice #Surface and Thin Film Phenomena #cond-mat.mes-hall #van der Waals force
paper · pdf · doi:10.1038/s41467-020-20428-1
published as Nat Commun 12, 242 (2021) · Main-text: 15 pages, 3 figures; Changes: Fig. 1a revised, expanded reference list, added supplementary information
openalex created_date 2020/08/18 · arxiv created 2020/11/27 · openalex publication_date 2021/01/11 · arxiv updated 2021/01/12 · openalex updated_date 2026/08/06
Abstract The emerging field of twistronics, which harnesses the twist angle between two-dimensional materials, represents a promising route for the design of quantum materials, as the twist-angle-induced superlattices offer means to control topology and strong correlations. At the small twist limit, and particularly under strain, as atomic relaxation prevails, the emergent moiré superlattice encodes elusive insights into the local interlayer interaction. Here we introduce moiré metrology as a combined experiment-theory framework to probe the stacking energy landscape of bilayer structures at the 0.1 meV/atom scale, outperforming the gold-standard of quantum chemistry. Through studying the shapes of moiré domains with numerous nano-imaging techniques, and correlating with multi-scale modelling, we assess and refine first-principle models for the interlayer interaction. We document the prowess of moiré metrology for three representative twisted systems: bilayer graphene, double bilayer graphene and H-stacked MoSe 2 /WSe 2 . Moiré metrology establishes sought after experimental benchmarks for interlayer interaction, thus enabling accurate modelling of twisted multilayers.