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Spectroscopic Signatures of Electronic Excitations in Raman Scattering in Thin Films of Rhombohedral Graphite

2019/05/31 by A. Garcia-Ruiz Fuentes, Aitor García-Ruiz, S. Slizovskiy +5 · 20 citations
Chemistry · Engineering · Materials Science · Physics and Astronomy · #2D Materials and Applications #Advancements in Battery Materials #Chemistry #Condensed matter physics #Crystal structure #Crystallography #Graphene research and applications #Graphite #Materials science #Metallurgy #Nanotechnology #Optics #Physics #Raman scattering #Raman spectroscopy #Scattering #Thin film #Trigonal crystal system #X-ray Raman scattering #cond-mat.mes-hall

paper · pdf · open access · doi:10.1021/acs.nanolett.9b02196

published in Nano Letters 19(9), 6152-6156 (American Chemical Society) · 15 pages in preprint format, 4 figures, accepted version

openalex publication_date 2019/07/30 · arxiv created 2019/08/07 · openalex created_date 2019/08/13 · arxiv updated 2019/09/13 · openalex updated_date 2026/08/05

Abstract

Rhombohedral graphite features peculiar electronic properties, including persistence of low-energy surface bands of a topological nature. Here, we study the contribution of electron-hole excitations toward inelastic light scattering in thin films of rhombohedral graphite. We show that, in contrast to the featureless electron-hole contribution toward Raman spectrum of graphitic films with Bernal stacking, the inelastic light scattering accompanied by electron-hole excitations in crystals with rhombohedral stacking produces distinct features in the Raman signal which can be used both to identify the stacking and to determine the number of layers in the film.

Citations