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Determining interface dielectric losses in superconducting coplanar waveguide resonators

2018/08/30 by Wayne Woods, Greg Calusine, Alexander Melville +6 · 1 citation
Physics and Astronomy · #quant-ph #cond-mat.supr-con

paper · pdf · doi:10.1103/physrevapplied.12.014012

published as Phys. Rev. Applied 12, 014012 (2019)

arxiv created 2018/08/30 · arxiv updated 2019/07/17

Abstract

Superconducting quantum computing architectures comprise resonators and qubits that experience energy loss due to two-level systems (TLS) in bulk and interfacial dielectrics. Understanding these losses is critical to improving performance in superconducting circuits. In this work, we present a method for quantifying the TLS losses of different bulk and interfacial dielectrics present in superconducting coplanar waveguide (CPW) resonators. By combining statistical characterization of sets of specifically designed CPW resonators on isotropically etched silicon substrates with detailed electromagnetic modeling, we determine the separate loss contributions from individual material interfaces and bulk dielectrics. This technique for analyzing interfacial TLS losses can be used to guide targeted improvements to qubits, resonators, and their superconducting fabrication processes.

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