2018/06/12 by Giuseppe Mercurio, G Mercurio, Igor A. Makhotkin +15
Biochemistry, Genetics and Molecular Biology · Materials Science · Physics and Astronomy · #Advanced Electron Microscopy Techniques and Applications #Advanced X-ray Imaging Techniques #DESY #Electron and X-Ray Spectroscopy Techniques #Femtosecond #Laser #Standing wave #Surface (topology) #Surface structure #Yield (engineering) #cond-mat.mtrl-sci
paper · pdf · doi:10.1088/1367-2630/aafa47
arxiv created 2018/06/12 · openalex created_date 2018/06/21 · openalex publication_date 2018/12/20 · arxiv updated 2019/05/22 · openalex updated_date 2026/08/05
We demonstrate the structural sensitivity and accuracy of the x-ray standing wave technique at a high repetition rate free-electron laser, FLASH at DESY in Hamburg, by measuring the photoelectron yield from the surface SiO 2 of Mo/Si multilayers. These experiments open up the possibility to obtain unprecedented structural information of adsorbate and surface atoms with picometer spatial and femtosecond temporal resolution. This technique will substantially contribute to a fundamental understanding of chemical reactions at catalytic surfaces and the structural dynamics of superconductors.