2018/07/28 by Tyler R. Harvey, Fehmi Sami Yasin, Fehmi S. Yasin +15 · 33 citations
Biochemistry, Genetics and Molecular Biology · Engineering · Physics and Astronomy · #Advanced Electron Microscopy Techniques and Applications #Beam splitter #Contrast (vision) #Diffraction #Diffraction grating #Force Microscopy Techniques and Applications #Grating #Integrated Circuits and Semiconductor Failure Analysis #Interferometry #Laser #Materials science #Optics #Physics #Scanning electron microscope #Transmission electron microscopy #cond-mat.mtrl-sci #physics.ins-det #physics.optics
paper · pdf · doi:10.1103/physrevapplied.10.061001
published in Physical Review Applied 10(6) (American Physical Society)
arxiv created 2018/07/28 · openalex publication_date 2018/12/26 · openalex created_date 2019/01/01 · arxiv updated 2019/01/02 · openalex updated_date 2026/08/05
Electron microscopes can image atoms in solids, molecules, and fields, but typically a different imaging method is used for each. The authors demonstrate a technique called scanning transmission electron microscopy (STEM) holography that is highly sensitive to electric and magnetic fields, is capable of subatomic resolution, and is efficient enough to minimize degradation of easily-damaged materials. With a single STEM holographic image, one could distinguish crystallized clusters on the surface of a nanoparticle and detect an electric field due to charging of the particle. All it takes is one diffraction grating installed in any TEM with a high-throughput camera.