Robust, self-consistent, closed-form tomography of quantum logic gates on a trapped ion qubit

2013/10/16 by Robin Blume-Kohout, Blume-Kohout, Robin, John King Gamble +9 · 7 citations
Biochemistry, Genetics and Molecular Biology · Materials Science · Physics and Astronomy · #Advanced Electron Microscopy Techniques and Applications #Electron and X-Ray Spectroscopy Techniques #FOS: Physical sciences #Force Microscopy Techniques and Applications #Quantum Physics (quant-ph)

paper · pdf · doi:10.48550/arxiv.1310.4492

openalex publication_date 2013/10/16 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

We introduce and demonstrate experimentally: (1) a framework called "gate set tomography" (GST) for self-consistently characterizing an entire set of quantum logic gates on a black-box quantum device; (2) an explicit closed-form protocol for linear-inversion gate set tomography (LGST), whose reliability is independent of pathologies such as local maxima of the likelihood; and (3) a simple protocol for objectively scoring the accuracy of a tomographic estimate without reference to target gates, based on how well it predicts a set of testing experiments. We use gate set tomography to characterize a set of Clifford-generating gates on a single trapped-ion qubit, and compare the performance of (i) standard process tomography; (ii) linear gate set tomography; and (iii) maximum likelihood gate set tomography.

Citations

• Numerical optimization

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