2018/01/16 by J. Manfredi, Jenny Lee, W. G. Lynch +27 · 15 citations
Physics and Astronomy · #Calibration #Computer science #Dead time #Detector #Energy (signal processing) #Layer (electronics) #Materials science #Nanotechnology #Nuclear Physics and Applications #Optics #Optoelectronics #Particle Detector Development and Performance #Physics #Position (finance) #Radiation Detection and Scintillator Technologies #Resolution (logic) #Silicon #nucl-ex #physics.ins-det
paper · pdf · doi:10.1016/j.nima.2017.12.082
published in Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment 888, 177-183 (Elsevier BV) · Accepted for publication in Nuclear Instruments and Methods in Physics Research
openalex publication_date 2018/01/16 · arxiv created 2018/01/18 · openalex created_date 2018/01/26 · arxiv updated 2018/03/14 · openalex updated_date 2026/08/06
In this work, two particular properties of the position-sensitive, thick silicon detectors (known as the "E" detectors) in the High Resolution Array (HiRA) are investigated: the thickness of the dead layer on the front of the detector, and the overall thickness of the detector itself. The dead layer thickness for each E detector in HiRA is extracted using a measurement of alpha particles emitted from a 212Pb pin source placed close to the detector surface. This procedure also allows for energy calibrations of the E detectors, which are otherwise inaccessible for alpha source calibration as each one is sandwiched between two other detectors. The E detector thickness is obtained from a combination of elastically scattered protons and an energy-loss calculation method. Results from these analyses agree with values provided by the manufacturer.