2017/09/25 by Mohammad Kamandi, Mohammad Albooyeh, Caner Guclu +4
Engineering · Physics and Astronomy · #Characterization (materials science) #Constructive #Force Microscopy Techniques and Applications #Mechanical and Optical Resonators #Microscopy #Near-Field Optical Microscopy #Optical microscope #Photon #Polarized light microscopy #Two-photon excitation microscopy #physics.optics
paper · pdf · doi:10.1103/physrevapplied.8.064010
published as Phys. Rev. Applied 8, 064010 (2017)
arxiv created 2017/09/25 · openalex created_date 2017/10/06 · openalex publication_date 2017/12/11 · arxiv updated 2017/12/20 · openalex updated_date 2026/08/05
The authors describe a high-resolution microscopy technique for the detection and characterization of chiral samples less than 100 nm in scale. Conventional techniques require a considerable amount of sample, and are vulnerable to background noise. The proposed photoinduced-force microscopy is based on near-field effects that are isolated from the background. Circularly polarized photons induce force on a cantilever, transferring optical activity from a chiral sample to an achiral probe. This technology has the potential to advance the control of constructive interaction between drugs and receptors in the human body.