2016/02/18 by Hideki Masuda · 1 citation
Engineering · Physics and Astronomy · Chemistry · #Molecular Junctions and Nanostructures #Force Microscopy Techniques and Applications #Surface and Thin Film Phenomena #High-resolution transmission electron microscopy #Transmission electron microscopy #Materials science #Atomic units #Nanotechnology #Conductive atomic force microscopy #Scanning tunneling microscope #Nanometre #In situ #Fabrication #Electron microscope #Kelvin probe force microscope #Microscope #Atomic force microscopy #Optics #Composite material #Chemistry #Physics
paper · pdf · doi:10.5772/62288
openalex publication_date 2016/02/18 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/01
This chapter introduces the research of in situ high-resolution transmission electron microscope (HRTEM) methods combined with the functions of atomic force microscope and scanning tunneling microscope. Using this method, we demonstrate fabrication, dynamic observation on an atomistic scale, and mechanical and electrical measurements of nanometer-sized contact simultaneously. We evaluate the silver atomic-sized wire (ASW) which appeared at the final stage of the rupture process of the silver nano-contact.