1998/04/27 by Ilya Chuprakov, Klaus‐Hermann Dahmen · 2 citations
Chemistry · Engineering · Materials Science · #Analytical Chemistry (journal) #Chalcogenide Semiconductor Thin Films #Chemistry #Electron beam physical vapor deposition #Evaporation #Giant magnetoresistance #Magnetic and transport properties of perovskites and related materials #Magnetic field #Magnetoresistance #Materials science #Metallurgy #Nanotechnology #Nuclear magnetic resonance #Phase-change materials and chalcogenides #Stoichiometry #Telluride #Tellurium #Texture (cosmology) #Thin film #X-ray photoelectron spectroscopy
paper · doi:10.1063/1.121309
openalex publication_date 1998/04/27 · openalex created_date 2025/10/10 · openalex updated_date 2026/06/26
Thin films of Ag2Te were obtained by vapor transport and electron beam evaporation methods. The film phase and chemical compositions were analyzed by x-ray diffraction and x-ray photoelectron spectroscopy analyses, respectively. Film composition was close to stoichiometric with a slight excess of tellurium. Strong (1̄21) texture was found in the films obtained by the electron beam evaporation. Magnetoresistance (MR) measurements show different temperature dependencies for oriented and nonoriented films. MR of the oriented films has a strong peak up to 390% at 90 K and 5 T, whereas MR of the nonoriented films is almost temperature independent in the 10–100 K range. Some analogies can be found between these materials and colossal MR and nonmagnetic multilayer MR materials.