1995/06/01 by Thomas N. Blanton, T. C. Huang, H. Toraya +7 · 2 citations
Materials Science · Arts and Humanities · Physics and Astronomy · Mathematics · Chemistry · #X-ray Diffraction in Crystallography #Cultural Heritage Materials Analysis #X-ray Spectroscopy and Fluorescence Analysis #Diffraction #Calibration #Range (aeronautics) #Materials science #Powder diffraction #Analytical Chemistry (journal) #Optics #Crystallography #Physics #Mathematics #Statistics #Chemistry
paper · doi:10.1017/s0885715600014421
openalex publication_date 1995/06/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/05/21
A task group of the JCPDS—International Center for Diffraction Data (ICDD) was established with the charge of investigating the use of silver behenate, CH 3 (CH 2 ) 20 COO·Ag, as a possible low-angle calibration standard for powder diffraction applications. Utilizing several data collection and analysis techniques, long-period spacing ( d 001 ) values with a range of 58.219–58.480 Å were obtained. Using the same collected data and one data analysis refinement calculation method resulted in dm values with a range of 58.303–58.425 Å. Data collected using a silicon internal standard and the same singular data analysis calculation method provided d 001 values with a range of 58.363–58.381 Å.