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Strongly Enhanced Thermal Stability of Crystalline Organic Thin Films\n Induced by Aluminum Oxide Capping Layers

2004/07/22 by Stefan Sellner, Alexander Gerlach, Sellner, Stefan +19
Engineering · Materials Science · Physics and Astronomy · #FOS: Physical sciences #Materials Science (cond-mat.mtrl-sci) #Phase-change materials and chalcogenides #Photorefractive and Nonlinear Optics #Semiconductor materials and devices #cond-mat.mtrl-sci

paper · pdf · doi:10.48550/arxiv.cond-mat/0407588

5 pages, 4 figures, submitted to Adv. Mat., for further information see http://www.physchem.ox.ac.uk/~fs

arxiv created 2004/07/22 · openalex publication_date 2004/07/22 · arxiv updated 2009/12/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/07/28

Abstract

We show that the thermal stability of thin films of the organic semiconductor\ndiindenoperylene (DIP) can be strongly enhanced by aluminum oxide capping\nlayers. By thermal desorption spectroscopy and in-situ X-ray diffraction we\ndemonstrate that organic films do not only stay on the substrate, but even\nremain crystalline up to 460C, i.e. 270 deg. above their desorption point for\nuncapped films (190C). We argue that this strong enhancement of the thermal\nstability compared to uncapped and also metal-capped organic layers is related\nto the very weak diffusion of aluminum oxide and the structurally well-defined\nas-grown interfaces. We discuss possible mechanisms for the eventual breakdown\nat high temperatures.\n

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