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Limits of detection for time of flight secondary ion mass spectrometry (ToF-SIMS) and X-ray photoelectron spectroscopy (XPS): detection of low amounts of adsorbed protein

2002/01/01 by Matthew S. Wagner, Sally L. McArthur, Mingchao Shen +2 · 2 citations
Chemistry · Engineering · #Adsorption #Analytical Chemistry (journal) #Analytical chemistry methods development #Chemistry #Chromatography #Ion #Ion-mobility spectrometry #Ion-surface interactions and analysis #Mass Spectrometry Techniques and Applications #Mass spectrometry #Materials science #Nuclear magnetic resonance #Optics #Physical chemistry #Physics #Secondary ion mass spectrometry #Static secondary-ion mass spectrometry #Time of flight #X-ray #X-ray photoelectron spectroscopy

paper · doi:10.1163/156856202320253938

openalex publication_date 2002/01/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/01

Abstract

Characterization of biomaterial surfaces requires analytical techniques that are capable of detecting a wide concentration range of adsorbed protein. This range includes detection of low amounts of adsorbed protein (<10 ng/cm2) that may be present on non-fouling biomaterials. X-ray Photoelectron Spectroscopy (XPS) and Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) are surface sensitive techniques capable of detecting adsorbed proteins. We have investigated the lower limits of detection of both XPS and ToF-SIMS on four model substrates each presenting unique challenges for analysis by XPS and ToF-SIMS: mica, poly(tetrafluoroethylene), allyl amine plasma polymer and heptyl amine plasma polymer. The detection limit for XPS ranged from 10 ng/cm2 of fibrinogen (on mica) to 200 ng/cm2 (on allyl amine plasma polymers). The detection limit for ToF-SIMS ranged from 0.1 ng/cm2 of fibrinogen to 100 ng/cm2, depending on the substrate and data analysis. Optimal conditions provided detection limits between 0.1 ng/cm2 and 15 ng/cm2 on all of the substrates used in this study. While both techniques were shown to be effective in detecting protein, the sensitivity of both XPS and ToF-SIMS was shown to be dependent on substrate surface chemistry and the organization of the adsorbed protein film. This study specifically highlights the applicability of ToF-SIMS in the characterization of low level protein adsorption.

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