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Heating of a trapped ion induced by dielectric materials

2021/03/25 by Markus Teller, Dario A. Fioretto, Dario Fioretto +10 · 3 citations
Computer Science · Physics and Astronomy · #Cold Atom Physics and Bose-Einstein Condensates #Quantum Information and Cryptography #Quantum optics and atomic interactions #cond-mat.mtrl-sci #quant-ph

paper · pdf · doi:10.1103/physrevlett.126.230505

published as Phys. Rev. Lett. 126, 230505 (2021)

arxiv created 2021/03/25 · openalex publication_date 2021/06/11 · arxiv updated 2021/06/16 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/05

Abstract

Electric-field noise due to surfaces disturbs the motion of nearby trapped ions, compromising the fidelity of gate operations that are the basis for quantum computing algorithms. We present a method that predicts the effect of dielectric materials on the ion's motion. Such dielectrics are integral components of ion traps. Quantitative agreement is found between a model with no free parameters and measurements of a trapped ion in proximity to dielectric mirrors. We expect that this approach can be used to optimize the design of ion-trap-based quantum computers and network nodes.

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