2015/11/16 by Aleksey Kozikov, A. A. Kozikov, Richard Steinacher +9
Engineering · Physics and Astronomy · #Advancements in Semiconductor Devices and Circuit Design #Capacitive coupling #Condensed matter physics #Conductance #Coupling (piping) #Electrical engineering #Interference (communication) #Laser #Materials science #Microscopy #Optics #Optoelectronics #Physics #Plateau (mathematics) #Quantum #Quantum and electron transport phenomena #Quantum mechanics #Quantum point contact #Quantum well #Scanning capacitance microscopy #Scanning gate microscopy #Semiconductor Quantum Structures and Devices #Voltage #cond-mat.mes-hall
paper · pdf · doi:10.1021/acs.nanolett.5b03170
published as Nano Lett. 15, 7994 (2015) · 17 pages, 4 figures
openalex publication_date 2015/11/16 · arxiv created 2015/11/25 · arxiv updated 2016/03/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/08/05
We demonstrate a scanning gate grid measurement technique consisting in measuring the conductance of a quantum point contact (QPC) as a function of gate voltage at each tip position. Unlike conventional scanning gate experiments, it allows investigating QPC conductance plateaus affected by the tip at these positions. We compensate the capacitive coupling of the tip to the QPC and discover that interference fringes coexist with distorted QPC plateaus. We spatially resolve the mode structure for each plateau.