2002/03/01 by Aman Haque, M. A. Haque, M. Taher A. Saif +1 · 2 citations
Engineering · Materials Science · Physics and Astronomy · #Copper Interconnects and Reliability #Force Microscopy Techniques and Applications #Metal and Thin Film Mechanics
paper · doi:10.1007/bf02411059
crossref issued 2002/03/01 · crossref published 2002/03/01 · crossref published-print 2002/03/01 · openalex publication_date 2002/03/01 · crossref created 2006/04/20 · crossref deposited 2025/01/08 · openalex created_date 2025/10/10 · crossref indexed 2026/01/31 · openalex updated_date 2026/07/23