2010/07/22 by Simin Feng
Engineering · Materials Science · Physics and Astronomy · #Ambiguity #Anisotropy #Electromagnetic Scattering and Analysis #Graphical model #Layer (electronics) #Metamaterials and Metasurfaces Applications #Microwave and Dielectric Measurement Techniques #Orthorhombic crystal system #Permittivity #Phase (matter) #Phase retrieval #physics.optics
paper · pdf · doi:10.1364/oe.18.017009
Accepted for publication in Optics Express
arxiv created 2010/07/22 · openalex publication_date 2010/07/26 · arxiv updated 2015/05/19 · openalex created_date 2016/06/24 · openalex updated_date 2026/08/05
We apply the equivalent theory to orthorhombic anisotropic materials and provide a general unit-cell design criterion for achieving a length-independent retrieval of the effective material parameters from a single layer of unit cells. We introduce a graphical retrieval method and phase unwrapping techniques. The graphical method utilizes the linear regression technique. Our method can reduce the uncertainty of experimental measurements and the ambiguity of phase unwrapping. Moreover, the graphical method can simultaneously determine the bulk values of the six effective material parameters, permittivity and permeability tensors, from a single layer of unit cells.