Tuning the graphene work function by electric field effect

2009/09/04 by Young-Jun Yu, Yue Zhao, Sunmin Ryu +3 · 1 citation
Physics and Astronomy · #cond-mat.mes-hall #cond-mat.mtrl-sci

paper · pdf · doi:10.1021/nl901572a

11 pages and 8 figures including supplementary information, to appear in Nano Letters

arxiv created 2009/09/04 · arxiv updated 2015/05/14

Abstract

We report variation of the work function for single and bi-layer graphene devices measured by scanning Kelvin probe microscopy (SKPM). Using the electric field effect, the work function of graphene can be adjusted as the gate voltage tunes the Fermi level across the charge neutrality point. Upon biasing the device, the surface potential map obtained by SKPM provides a reliable way to measure the contact resistance of individual electrodes contacting graphene.

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• Modification of the scattering mechanisms in bilayer graphene in proximity to a molecular thin film probed in the mesoscopic regime

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