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Self-testing of semisymmetric informationally complete measurements in a qubit prepare-and-measure scenario

2023/06/12 by Gábor Drótos, Drótos, Gábor, Károly F. Pál +3 · 1 citation
Computer Science · Physics and Astronomy · #FOS: Physical sciences #Quantum Information and Cryptography #Quantum Physics (quant-ph) #Quantum and electron transport phenomena #Surface and Thin Film Phenomena

paper · pdf · doi:10.48550/arxiv.2306.07248

openalex publication_date 2023/06/12 · openalex created_date 2023/06/14 · openalex updated_date 2026/07/28

Abstract

Self-testing is a powerful method for certifying quantum systems. Initially proposed in the device-independent (DI) setting, self-testing has since been relaxed to the semi-device-independent (semi-DI) setting. In this study, we focus on the self-testing of a specific type of non-projective qubit measurements belonging to a one-parameter family, using the semi-DI prepare-and-measure (PM) scenario. Remarkably, we identify the simplest PM scenario discovered so far, involving only four preparations and four measurements, for self-testing the fourth measurement. This particular measurement is a four-outcome non-projective positive operator-valued measure (POVM) and falls in the class of semisymmetric informationally complete (semi-SIC) POVMs introduced by Geng et al. [Phys. Rev. Lett. 126, 100401 (2021)]. To achieve this, we develop analytical techniques for semi-DI self-testing in the PM scenario. Our results shall pave the way towards self-testing any extremal qubit POVM within a potentially minimal PM scenario.

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