2014/10/10 by Vesna Berec · 10 citations
Biochemistry, Genetics and Molecular Biology · Engineering · Physics and Astronomy · #Advanced Electron Microscopy Techniques and Applications #Atom (system on chip) #Atomic physics #Bohr model #Bohr radius #Characterization (materials science) #Crystallography and Radiation Phenomena #Electron #Ion-surface interactions and analysis #Laser #Materials science #Nanolaser #Nanotechnology #Optics #Optoelectronics #Physics #Quantum dot #Quantum mechanics #RADIUS #Silicon #cond-mat.mtrl-sci #quant-ph
paper · pdf · doi:10.1017/s0263034614000482
published in Laser and Particle Beams 33(1), 1-9 (Cambridge University Press) · 27 pages, 10 figures, Laser and Particle Beams, Cambridge Journals, 2014
openalex publication_date 2014/10/10 · arxiv created 2014/10/19 · arxiv updated 2015/04/21 · openalex created_date 2016/06/24 · openalex updated_date 2026/08/05
Abstract We present low-dimensional functionalization and characterization of electron density of states using highly correlated/precisely guided proton beam trajectories and a silicon nanocrystal as a target, representing at a same time a versatile nanolaser technique capable for coherent control of atomic quantum states and for scanning the interior of an atom with resolution comparable to 10% of the Bohr radius.