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Critical analysis and remedy of switching failures in straintronic logic using Bennett clocking in the presence of thermal fluctuations

2014/01/06 by Kuntal Roy · 1 citation
Engineering · Materials Science · Physics and Astronomy · #Coupling (piping) #Electronic circuit #Fast switching #Ferroelectric and Negative Capacitance Devices #Interconnection #Logic gate #Magnetic properties of thin films #Magnetization #Magnetization dynamics #Multiferroics and related materials #Thermal #Thermal fluctuations #cond-mat.mes-hall

paper · pdf · doi:10.1063/1.4858484

published as Appl. Phys. Lett. 104, 013103 (2014)

openalex publication_date 2014/01/06 · arxiv created 2015/04/17 · arxiv updated 2015/04/21 · openalex created_date 2016/06/24 · openalex updated_date 2026/08/05

Abstract

Straintronic logic is a promising platform for beyond Moore's law computing. Using Bennett clocking mechanism, information can propagate through an array of strain-mediated multiferroic nanomagnets, exploiting the dipolar coupling between the magnets without having to physically interconnect them. Here, we perform a critical analysis of switching failures, i.e., error in information propagation due to thermal fluctuations through a chain of such straintronic devices. We solved stochastic Landau-Lifshitz-Gilbert equation considering room-temperature thermal perturbations and show that magnetization switching may fail due to inherent magnetization dynamics accompanied by thermally broadened switching delay distribution. Avenues available to circumvent such issue are proposed.

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