2016/06/04 by Ayaka Fujimoto, Yasuhiro Yamada, Michio Koinuma +1 · 3 citations
Materials Science · Engineering · #Diamond and Carbon-based Materials Research #Graphene research and applications #Semiconductor materials and devices
paper · doi:10.1021/acs.analchem.6b01327
openalex publication_date 2016/06/04 · openalex created_date 2016/06/24 · openalex updated_date 2026/07/30
X-ray photoelectron spectroscopy (XPS) is among the most powerful techniques to analyze defective structures of carbon materials such as graphene and activated carbon. However, reported assignments of defects, especially sp(3)C and sp(2)C, are questionable. Most reports assign sp(3)C peaks to be higher than sp(2)C peaks, whereas a few reports assign sp(3)C peaks to be lower than sp(2)C peaks. Our group previously reported that calculated binding energies of sp(3)C were basically lower than those of sp(2)C. This work clarified that one of the reasons for the prevailing ambiguous assignments of sp(3)C peaks is charging effects of diamond.