1971/11/01 by M.F. Tompsett, G. F. Amelio, W.J. Bertram +4 · 1 citation
Engineering · Physics and Astronomy · #Advanced Optical Sensing Technologies #CCD and CMOS Imaging Sensors #Charge (physics) #Charge-coupled device #Computer science #Electronic engineering #Engineering #Fabrication #Image Processing Techniques and Applications #Materials science #Optics #Optoelectronics #Physics #Time delay and integration #Transfer (computing)
paper · doi:10.1109/t-ed.1971.17321
openalex publication_date 1971/11/01 · openalex created_date 2025/10/10 · openalex updated_date 2026/06/11
The design and fabrication of a 96-element 3-phase linear charge-coupled device are described. A transfer efficiency of ∼95 percent over 288 transfers at a 1-MHz clock rate was measured. The use of the device as an analog delay line is demonstrated and its imaging properties are illustrated with reproductions of black and white text and a picture with gray scale. The results demonstrate the feasibility of using self-scanned imaging devices in practical applications. Configurations are presented for both an improved linear and an area imaging device. In both cases the problem of image smear, which occurs if stored charge is transferred along the light-sensitive region and if significant light integration takes place during this transfer, can be avoided.