2009/05/06 by Vladimir V. Shvartsman, V. V. Shvartsman, Jiwei Zhai +2 · 1 citation
Engineering · Materials Science · #Ceramic #Composite material #Condensed matter physics #Dielectric #Domain wall (magnetism) #Ferroelectric and Piezoelectric Materials #Ferroelectricity #Materials science #Microwave Dielectric Ceramics Synthesis #Multiferroics and related materials #Nuclear magnetic resonance #Optoelectronics #Physics #Piezoresponse force microscopy #Polar #Relaxation (psychology) #Solid solution #Zirconium
paper · doi:10.1080/00150190902850822
openalex publication_date 2009/05/06 · crossref created 2009/05/06 · crossref issued 2009/05/18 · crossref published 2009/05/18 · crossref published-print 2009/05/18 · crossref deposited 2019/05/19 · openalex created_date 2025/10/10 · crossref indexed 2026/08/04 · openalex updated_date 2026/08/04
The low frequency dielectric relaxation of BaTi 1 − x Zr x O 3 ceramics is investigated by means of dielectric spectroscopy. The ferroelectric state of compositions with x ≤ 0.20 was verified by piezoresponse force microscopy. Correspondingly, domain wall relaxation was revealed in dielectric spectra for these compositions. The gradual crossover from ferroelectric to relaxor behavior in samples with larger zirconium content is characterized by both vanishing of the contribution due to domain walls and the appearance of relaxation related to reorientation of polar nanosized regions. The appearance of relaxor properties is supposed to be due to both weak random fields and disorder inherent in pure BaTiO 3 .